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The grazing incidence X-ray reflectivity (GIXRR) is a kind of non-destructive inspection technology and absolute measurement method, which is used in the thin-film measurement broadly.In this study, the SiO2 layers with nominal thicknesses of 10nm, 20nm and 50nm were measured by GIXRR technology, which can be obtained by fitting the whole spectral reflectance curves based on the Parratt recurrence formula.