【摘 要】
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Functional testing of todays highly complex devices offers many challenges. Digital device tests include both traditional deterministic pattern tests and digital tests that produce variable data outpu
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Functional testing of todays highly complex devices offers many challenges. Digital device tests include both traditional deterministic pattern tests and digital tests that produce variable data output. Register-based setup and digital waveform capture is common in many devices.The Digital Source and Capture features offer powerful solutions to these test challenges. Creative application of Digital Source and Capture can save test time, reduce test setup maintenance and improve reusability of test program content.A Digital Source technique for efficient register-based device setup is described. It offers great flexibility during program development, fast and efficient multi-site support for variable trim data and zero execution time overhead in most applications.A Digital Capture technique for fast data re-alignment to a frame-sync signal without using match-loops is described.
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