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本文利用扫描电子显微镜(SEM)的二次电子影像富有很强的立体感这一特点,对卤化银T颗粒的厚度及宽厚比进行了测量和观察,介绍了这种电镜样品的制备技术,以及利用SEM的倾斜角效应拍摄能反映微粒空间立体形状和T颗粒厚度的方法。
In this paper, the thickness and aspect ratio of silver halide T particles were measured and observed by using the secondary electron image of scanning electron microscope (SEM) Using the tilt angle effect of SEM, the method can reflect the three-dimensional shape of the particle space and the thickness of the T particle.