论文部分内容阅读
由电子工业部下达的“八五”国家重点科技攻关项目:《测试程序库的开发》专题,在集成电路测试技术中心通过专家鉴定及国家验收。 集成电路广泛应用于各电子领域,因此,对集成电路的检测已成为保证各类电子产品质量必不可少的环节。集成电路里面包含了成千上万甚至几十万个晶体管,连线纵横交错。要通过露在外面的有限管脚来测定电路的好坏是个高难技术问题,这正是集成电路测试所要解决的。世界先进国家在发展微电子技术与
The Key National Science and Technology Project of the Eighth “Five-Year Plan” issued by the Ministry of Electronics Industry: The topic of “Development of Test Libraries” passed the expert appraisal and national acceptance at the IC Testing Technology Center. Integrated circuits are widely used in various electronic fields, therefore, the detection of integrated circuits has become an indispensable part of ensuring the quality of various electronic products. The integrated circuit contains thousands or even hundreds of thousands of transistors, the connection criss-cross. It is a difficult technical problem to determine whether the circuit is good or bad by the limited pins exposed to the outside, which is exactly what the IC test needs to solve. The advanced countries in the world are developing microelectronic technology