本文叙述了采用部分灰化法集石墨中杂质元素(富集系数～10),然后加入NaCl“载体”,用粉末法进行光谱测定的方法。若杂质元素含量较高,不用富集,可以直接进行测定。本方法可测定纯石墨中的12个杂质元素。当富集系数约为10时,其测定下限为:Cu 0.03ppm;Mg 0.05ppm;Mn,Fe,Al,V 0.1ppm;Sn,Si,Ni,Ti 0.3ppm;Ba,Cr1.0ppm。其单次摄谱的波动系数在±23%以内(除Si为±27%外);样品测定的波动系数在±25%以内。 This paper describes a method for spectrometric determination of impurities in graphite by the partial ashing method (enrichment factor ~ 10) followed by the addition of NaCl “carrier”. If the impurity element content is higher, without enrichment, can be directly measured. This method can be measured in pure graphite 12 impurity elements. When the enrichment factor is about 10, the lower limit of determination is: Cu 0.03ppm; Mg 0.05ppm; Mn, Fe, Al, V 0.1ppm; Sn, Si, Ni, Ti 0.3ppm; Ba, Cr 1.0ppm. The fluctuation coefficient of single spectrum was within ± 23% (except Si was ± 27%). The fluctuation coefficient of sample was within ± 25%.