引言一般说来,集成电路的可靠性问题是指用户通常不可能肯定某种器件在装备之前在使用环境中具有所要求的平均故障时间。根据失效物理学原理,保证集成电路可靠性有两种方法,这两种方法可以预料与识别在环境应力之下缺陷和失效机理,并有两种结果:其一,能选择装配前的应力,当把这应力加到器件上时,将会显示出缺陷和失效机 INTRODUCTION In general, the reliability issue for integrated circuits is that users often can not be sure that a device has the required average downtime in the environment of use before it is equipped. According to the principle of failure physics, there are two methods to ensure the reliability of integrated circuits. These two methods can predict and identify the mechanism of defects and failure under environmental stress and have two kinds of results. First, it can select the stress before assembly, When this stress is applied to the device, it will show defects and failures