通常X-射线分析法主要是指X-射线衍射分析和萤光X-射线光谱分析两大类。X-射线衍射分析是把晶体物质作为研究对象,通过衍射分析,可以得到物质结晶状态的独特衍射图样,揭示物质的晶体结构(或原子排列),进一步推知物质的物理性质和化学性质,并可推知使其原子排列变化时所引起的结果。衍射过程如图l所示。与X-射线衍射法不同,萤光X-射线光谱法是把构成物质的元素作为研究对象,如图2所示。当X-射线照射物质后,这物质放出具有特有波长的萤光X-射线,经晶体分光后,测 Usually X-ray analysis mainly refers to X-ray diffraction analysis and fluorescence X-ray spectrometry two broad categories. X-ray diffraction analysis takes the crystal material as the research object. Through the diffraction analysis, the unique diffraction pattern of the crystal state of the material can be obtained, the crystal structure (or atomic arrangement) of the material can be revealed, and the physical and chemical properties of the material can be further inferred. Infer the result of changing the atomic arrangement. Diffraction process shown in Figure l. Unlike the X-ray diffraction method, fluorescent X-ray spectrometry takes the elements that make up the substance as the object of study, as shown in FIG. 2. When X-rays irradiate the substance, the substance emits fluorescent X-rays with a characteristic wavelength. After being crystallized, the substance is measured