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TeO_x-SiO_2 composite films having third-order nonlinearities were prepared by electrochemically induced sol-gel deposition method on ITO substrate.The third-order optical nonlinearities of the films were measured by Z-scan technique.The third-order nonlinear susceptibilities(χ~((3))) of the as-prepared films are 5.9×10~(-7) to 4.29×10~(-6)esu.The surface morphology and composition of the films were characterized by SEM/EDX,which identified that Te metallic particles well dispersed in TeO_x-SiO_2 gel films.
TeO_x-SiO_2 composite films having third-order nonlinearities were prepared by electrochemically induced sol-gel deposition method on ITO substrate. Third-order optical nonlinearities of the films were measured by Z-scan technique. Third-order nonlinear susceptibilities (χ ~ ((3))) of as-prepared films are 5.9 × 10-7 (4.29 × 10-6) esu.The surface morphology and composition of the films were characterized by SEM / EDX, which identified that Te metallic particles well dispersed in TeO_x-SiO_2 gel films.