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(一)谱线测量方法用测微光度计测量谱线黑度时,当选用的分析谱线与内标谱线波长相差不大时,即二者在底片上相距较近时,对分析谱线与内标谱线可交错进行测量,不妨称之为“横测”。但是,当选用的分析谱线与内标谱线波长相差较大时,即二者在底片上相距较远时(例如用中等色散摄谱仪分析纯锌中Cd2288(?),Pb2833(?),Fe3020(?),Cu3273(?),内标谱线Zn2670(?)),还是采用“横测”方法,未免很费力。可改用“竖测”办法测量,即先将Cd2288(?)一并测完,再把Zn2670(?)也一并测完,再依次把Pb,Fe,Cu一并测完。
(A) line measurement method Micrometer photometric blackness measurement, when the selection of the analytical line and the internal standard wavelength of the line is not much difference, that is, when the two are close to the film, the analysis of the spectrum Lines and internal standard lines can be staggered measurement, may wish to call it “horizontal measurement ”. However, when the wavelength of the selected analytical line and the internal standard line differ a lot, that is, the two are far apart from each other on the film (for example, analysis of Cd2288 (?), Pb2833 (?) , Fe3020 (?), Cu3273 (?), The internal standard line Zn2670 (?)), Or the use of “horizontal measurement ” method, it is very easy. Can be used instead of “vertical measurement ” approach to measure, that is, the first Cd2288 (?) Measured together, and then Zn2670 (?) Also measured End, followed by the Pb, Fe, Cu measured together.