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目的:探究分析新生儿低血糖引起脑损伤的基本特点及危险原因。方法:选取2012年5月-2014年5月广州市荔湾区妇幼保健院收治的86例新生儿低血糖患儿作为研究对象,将发生脑损伤现象的患儿作为研究组,未发生脑损伤现象的患儿作为对照组,对两组患儿的血糖检查结果、围产期相关因素以及临床症状表现等进行总结性的对比分析。结果:Logistic分析显示,脑电图异常、低血糖维持的时间在24 h以上、血糖水平在1.5 mmol/L及其以下都和新生儿低血糖引起脑损伤密切相关;单因素研究显示,惊厥、胎龄、血糖水平、低血糖的维持时间、脑电图异常等与新生儿低血糖引起脑损伤有明显的联系,差异有统计学意义(P<0.05)。结论:惊厥、低血糖维持的时间在24 h以上、脑电图异常、血糖水平在1.5 mmol/L及以下都是新生儿低血糖引起脑损伤的重要危险原因,应尽早干预治疗。
Objective: To explore the basic characteristics and risk reasons of neonatal hypoglycemia-induced brain injury. Methods: From May 2012 to May 2014, 86 neonates with hypoglycemia admitted to Liwan District Maternal and Child Health Hospital of Guangzhou City were selected as the study subjects. The children with brain injury were selected as the study group and no brain injury occurred Of children as a control group, the two groups of children with blood glucose test results, perinatal factors and clinical symptoms were summarized comparative analysis. Results: Logistic analysis showed that EEG abnormality, hypoglycemia maintenance time more than 24 h, blood glucose levels below 1.5 mmol / L and below are closely related to neonatal hypoglycemia-induced brain injury; single factor studies have shown that convulsions, Gestational age, blood glucose level, hypoglycemia maintenance time, EEG abnormalities and neonatal hypoglycemia caused by brain injury were significantly associated with statistical significance (P <0.05). CONCLUSION: Seizures and hypoglycemia are maintained for more than 24 hours. EEG abnormalities and blood glucose levels below 1.5 mmol / L are all important risk factors for neonatal hypoglycemia-induced brain injury. Early intervention is recommended.