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为了优化不同波段红外读出电路的噪声性能,给出了系统的CTIA结构读出电路噪声模型,分析了积分电容与积分时间对不同成分噪声的影响,得出了在不同红外波段探测下,噪声随积分参数取值的变化曲线。该优化研究将红外传感器件的物理特性光电流大小与读出电路的噪声特性联系在了一起,阐明了对于不同红外波段的探测,在一定的制造工艺范围内,积分电容都有最优的取值,且取值与探测器的并联电容有直接的关系;输出噪声与电路结构相互的影响也是不同的,CDS结构对长波读出电路噪声性能的改善优于中波读出电路。
In order to optimize the noise performance of infrared readout circuits in different wavebands, the noise model of the CTIA readout circuit is given. The influence of integral capacitance and integration time on the noise of different components is analyzed. Under different infrared bands, With the integral parameter values of the curve. This optimization study correlates the physical characteristics of the infrared sensing device with the noise characteristics of the readout circuit. It is clarified that for the detection of different infrared bands, the integrated capacitance has an optimal value within a certain manufacturing process range Value and its value is directly related to the parallel capacitance of the detector. The influence of the output noise and the circuit structure is also different. The improvement of the noise performance of the CDS structure over the long-wave readout circuit is better than that of the medium-wave readout circuit.