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电子探针 X—射线显微分析,是近20年来发展起来的专门研究微粒微量成分的新技术之一。它能分析直径为一微米的微尘成分,对一立方微米的固体样品也能进行分析。若进行电子扫描观察,可以直接显示出样品表面一平方微米至几平方微米范围内元素的分布状态和微观结构,可同时对2—4种元素进行定性定量测定,并可观察2—4种图象。分析元素范围可从元素周期表上4号元素(Be_4)至92号元素(U_(92))。此外,它还具有在分析过程中不波坏样品,制样简单,在一般矿相光片上即可进行分析等特点。因此,在地质、冶金等部门广泛用来对矿石、材料进行微观分析和研究,也是地质工作者对矿床进行综合评价,确定选冶流程方案和找寻稀有金属及贵重金属矿床的有效
Electron probe X-ray microanalysis is one of the new technologies that has been developed in recent 20 years to study the trace components of micro-particles. It can analyze dust components with a diameter of one micron, and can also analyze solid samples of one cubic micron. If the electronic scanning observation can directly show the sample surface of a square micron to a few square microns of the distribution of elements and microscopic structure can be qualitative and quantitative determination of 2-4 elements at the same time can be observed 2-4 kinds of maps Like Analytical elements range from element # 4 (Be_4) to element # 92 (U_ (92)) on the periodic table. In addition, it also has the characteristics of not wasting samples during sample preparation, simple sample preparation and analysis on general mining phase light plates. Therefore, the geology, metallurgy and other departments are widely used for the microscopic analysis and research of ores and materials. It is also the result of geological workers’ comprehensive evaluation of ore deposits, the determination of the selection and smelting process scheme and the search for the effectiveness of rare metals and precious metal deposits