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系统LSI的存储器测试技术有直接存储器访问测试、高速直接存储器访问测试及内置自测试,几种方式各有优缺点,最好能加以组合应用。
System LSI memory test technology has direct memory access test, high-speed direct memory access test and built-in self-test, each of the advantages and disadvantages of several ways, the best combination of applications.