采用微波消解前处理样品,电感耦合等离子体质谱检测,以In作为内标物进行基体效应的补偿,同时测定了甜玉米、去胚甜玉米、甜玉米胚中的V、Cr、Co、Ga、Cd、Sn、Pb7种元素的含量。结果表明:所建立的方法简便、快速、准确,对于所测元素,标准曲线的相关系数r均大于0.99990,相对标准偏差小于4.73%,结果令人满意。 The samples were pre-treated with microwave digestion and detected by inductively coupled plasma-mass spectrometry. In was used as the internal standard to compensate the matrix effect. The contents of V, Cr, Co and Ga in sweet corn, Cd, Sn, Pb content of seven kinds of elements. The results showed that the established method was simple, rapid and accurate. The correlation coefficients r of the standard curve were all greater than 0.99990 and the relative standard deviations were less than 4.73%. The results were satisfactory.