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建立了ICP-AES直接测定钽合金中钨、铪的分析方法。采用基体匹配与背景扣除法消除钽基体对钨、铪的光谱干扰,选择多谱线平均值法进行了光谱分析。待测元素的回收率为98.0%—102.2%,相对标准偏差小于1.50%。本法简便、快速、准确度高,已用于钽合金产品的检验。
A direct method for the determination of tungsten and hafnium in tantalum alloys by ICP-AES was established. The matrix matching and background subtraction were used to eliminate the spectral interference of tantalum matrix to tungsten and hafnium. The spectral analysis was performed by choosing the average value method of multi-spectral lines. The recovery rate of the test element was 98.0% -102.2%, the relative standard deviation was less than 1.50%. This method is simple, fast and accurate. It has been used for the inspection of tantalum alloy products.