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随着计算技术的迅速发展,存储部件在整机硬件中所占的比重愈来愈大。目前大型计算机的主存储器容量大多在13万字以上。有人设想,用半导体存储器作主存,其容量可望达到8～23兆位组,周期在200～300毫微秒之间。从可靠性方面来看,主存储器是系统中薄弱环节之一。因此,如何提高存储器检测的效率和质量是当前面临的一个大问题。只有应用计算机,实现存储器检查的自动化,才能较好地解决这个矛盾。本文主要介绍一些具体的检测设备,对它们的系统结构和使用方法概述一下,从而说明用计算机实现存储器检测自动化的特点和效果。
With the rapid development of computing technology, the proportion of storage components in the whole hardware is getting larger and larger. At present, main computer main memory capacity mostly in more than 130,000 words. Some people assume that using semiconductor memory as the main memory, its capacity is expected to reach 8 to 23 megabits, the cycle of 200 to 300 nanoseconds. From the reliability point of view, main memory is one of the weaknesses in the system. Therefore, how to improve the efficiency and quality of memory testing is a big problem currently facing. Only by using a computer to automate the memory check can we better resolve this contradiction. This article describes some of the specific testing equipment, system structure and use of their overview, to illustrate the use of computer memory test automation features and effects.