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In situ angle dispersive synchrotron X-ray diffraction and Raman scattering measurements under pressure are employed to study the structural evolution of Cu4Bi4S9nanoribbons,which are fabricated by using a facile solvothermal method.Both experiments show that a structural phase transition occurs near 14.5 GPa,and there is a pressure-induced reversible amorphization at about 25.6 GPa.The electrical transport property of a single Cu4Bi4S9nanoribbon under different pressures is also investigated.
In situ angle dispersive synchrotron X-ray diffraction and Raman scattering measurements under pressure are employed to study the structural evolution of Cu4Bi4S9nanoribbons, which are fabricated by using a facile solvothermal method. Both experiments show that a structural phase transition occurs near 14.5 GPa, and there is a pressure-induced reversible amorphization at about 25.6 GPa. the electrical transport property of a single Cu4Bi4S9nanoribbon under different pressures is also investigated.