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功能级故障测试由于特大规模集成电路技术的发展而变得越来越重要.和门级的固定为0(s-a—0)或固定为1(s-a-1)故障模型及D-算法相对应,本文对于用寄存器传输语言描述的数字系统,给出一个功能级的故障模型及测试产生的算法.
Functional-level fault testing is becoming more and more important due to the development of very large-scale integrated circuit technology, which corresponds to a 0-level (sa-0) or fixed-1 (sa- This paper presents a functional-level fault model and the test-generated algorithm for a digital system described in Register Transfer Language.